Title: A Bayesian Network approach to County-Level Corn Yield Prediction Using Historical Data and Expert Knowledge
Date/Time: November 18^th, 2016 @ 9:50 AM
Place: 131 Atanasoff  Hall
Major Professors: Jin Tian, B Ganapathysubramanian and Soumik Sarkar

Abstract:

Crop yield forecasting is the methodology of predicting crop yields prior to harvest. The availability of accurate yield prediction frameworks have enormous implications from multiple standpoints, including impact on the crop commodity futures markets, formulation of agricultural policy, as well as crop insurance rating. The focus of this work is to construct a corn yield predictor at the county scale.

Vikas Chawla Final Oral.pdf